Projection x-ray microscope powered by highly charged ions

被引：23

作者：

Marrs, RE ^{[1
]}

Schneider, DH ^{[1
]}

McDonald, JW ^{[1
]}

机构：

[1] Univ Calif Lawrence Livermore Natl Lab, Livermore, CA 94551 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1998年 / 69卷 / 01期

关键词：

D O I：

10.1063/1.1148496

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Recombination of slow highly charged ions at the surface of a target foil can be used as a source of x rays for a projection x-ray microscope. In a first test of this concept, a low emittance beam of Ar18+ and Ar17+ ions from an electron beam ion trap was focused with einzel lenses to a 20 mu m full width at half maximum spot on a beryllium target foil. The 3 keV x rays from radiative deexcitation of the ions were used to obtain a magnified image of an electroformed nickel mesh with 20 mu m resolution by projection onto a CCD camera. Prospects for substantial improvements in resolution and intensity are discussed. (C) 1998 American Institute of Physics.

引用

页码：204 / 209

页数：6

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