Copper ferrite thin films: Single-step non-aqueous growth and properties

被引:13
作者
Lokhande, C. D.
Kulkarni, S. S.
Mane, R. S.
Han, Sung-Hwan
机构
[1] Hanyang Univ, Dept Chem, Inorgan Nanomat Lab, Seoul 133791, South Korea
[2] Shivaji Univ, Dept Phys, Thin Film Phys Lab, Kolhapur 416004, Maharashtra, India
关键词
AFM; SEM; XRD; electrodeposition; non-aqueous; dielectric constant; magnetic properties;
D O I
10.1016/j.jcrysgro.2006.12.063
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Copper ferrite thin films, synthesized on clean stainless steel substrates from an alkaline non-aqueous solution at room temperature as a soft ferrite, were integrated into magnetic properties. Effect of annealing at 773 K for 1 h on structural, surface morphological and dielectric properties was reported. The tetragonal crystal structure and monodispersed non-uniformly distributed porous islands were confirmed from XRD and SEM analyses, respectively. The annealed copper ferrite thin film when used in magnetic studies showed saturation magnetization of 284emu/cm(3). (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:387 / 390
页数:4
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