Proton energy dependence of the light output in gallium nitride light-emitting diodes

被引:32
作者
Khanna, SM [1 ]
Estan, D
Erhardt, LS
Houdayer, A
Carlone, C
Lonascut-Nedelcescu, A
Messenger, SR
Walters, RJ
Summers, GP
Warner, JH
Jun, I
机构
[1] Def Res Estab, Ottawa, ON K1A 0Z4, Canada
[2] Univ Montreal, Dept Phys, Montreal, PQ, Canada
[3] Univ Sherbrooke, Dept Phys, Sherbrooke, PQ J1K 2R1, Canada
[4] SFA Inc, Largo, MD 20774 USA
[5] USN, Res Lab, Washington, DC 20375 USA
[6] Univ Maryland Baltimore Cty, Baltimore, MD 21250 USA
[7] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
关键词
blue LEDs; energy dependence; gallium nitride; light emission degradation; non-ionizing energy loss (NIEL); optoelectronics; proton; quantum-well light-emitting diodes; radiation damage;
D O I
10.1109/TNS.2004.835097
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Gallium nitride (GaN)-based blue-emitting diodes (CREE Model C430-DH85) were irradiated at room temperature with protons in the energy range 2 to 115 MeV at fluences varying from 1 x 10(11) to 1 x 10(15) cm(-2). Light output degradation curves were obtained for each energy and the damage constant (A) associated with these curves was determined according to the theory of Rose and Barnes. For proton energies less than 10 MeV, A varies inversely with the proton energy (E). At higher energies, A is consistently above the 1 / E relationship. The change in nature of the energy dependence is attributed to nuclear interactions. Nonionizing energy loss calculations for the case of protons on GaN are presented. Good agreement between theory and experiment is obtained.
引用
收藏
页码:2729 / 2735
页数:7
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