Advanced mapping of science and technology

被引：41

作者：

Noyons, ECM ^{[1
]}

Van Raan, AFJ ^{[1
]}

机构：

[1] Leiden Univ, Ctr Sci & Technol Studies, CWTS, NL-2300 RB Leiden, Netherlands

来源：

SCIENTOMETRICS | 1998年 / 41卷 / 1-2期

关键词：

Noun Phrase; Average Impact; Advance Mapping; Neural Network Research; Extract Noun;

D O I：

10.1007/BF02457967

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

In the paper we will present the adjustments we implemented on the mapping procedure. We consider them as important improvements to make the maps more user-friendly. The improvements concern the implementation of graphical user interfaces, and the addition of 'map-external' information. This interface enables the users of the maps to focus onto their specific areas of interest and to determine the position of actors in the field. In addition the 'map-external' information contributes to an objective validation of the maps. The presentation will include a demonstration of the electronic maps and added tools.

引用

页码：61 / 67

页数：7

共 10 条

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