Diagnostics for Gaussian Process Emulators

被引:264
作者
Bastos, Leonardo S. [1 ]
O'Hagan, Anthony [1 ]
机构
[1] Univ Sheffield, Dept Probabil & Stat, Sheffield S3 7RH, S Yorkshire, England
基金
英国工程与自然科学研究理事会;
关键词
Bayesian inference; Computer experiments; Diagnostics; Emulation; Gaussian process; COMPUTER EXPERIMENTS; REFLECTANCE MODEL; LINEAR-MODEL; PLANT CANOPY; PREDICTION; SENSITIVITY; VALIDATION; RESIDUALS; OUTPUTS; DESIGN;
D O I
10.1198/TECH.2009.08019
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
Mathematical models, usually implemented in computer programs known as simulators, are widely used in all areas of science and technology to represent complex real-world phenomena. Simulators are often so complex that they take appreciable amounts of computer time or other resources to run. In this context, a methodology has been developed based on building a statistical representation of the simulator, known as an emulator. The principal approach to building emulators uses Gaussian processes. This work presents some diagnostics to validate and assess the adequacy of a Gaussian process emulator as surrogate for the simulator. These diagnostics are based on comparisons between simulator outputs and Gaussian process emulator outputs for some test data, known as validation data, defined by a sample of simulator runs not used to build the emulator. Our diagnostics take care to account for correlation between the validation data. To illustrate a validation procedure, we apply these diagnostics to two different data sets.
引用
收藏
页码:425 / 438
页数:14
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