Constant high-speed optical low-coherence reflectometry over 0.12m scan range

被引：8

作者：

Delachenal, N ^{[1
]}

Gianotti, R ^{[1
]}

Walti, R ^{[1
]}

Limberger, H ^{[1
]}

Salathe, RP ^{[1
]}

机构：

[1] Swiss Fed Inst Technol, Inst Appl Opt, CH-1015 Lausanne, Switzerland

来源：

ELECTRONICS LETTERS | 1997年 / 33卷 / 24期

关键词：

reflectometry; optical delay line;

D O I：

10.1049/el:19971358

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A constant high-speed optical low-coherence reflectometer is presented. The use of both the reference and sample arms as delay lines results in highly linear optical path length changes. Scan speeds of up to 96m/s are maintained over a range of typically 100mm with a speed variation of only 0.1%.

引用

页码：2059 / 2061

页数：3

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