Interferometer based on a surface-plasmon resonance for sensor applications

被引:85
作者
Kabashin, AV [1 ]
Nikitin, PI [1 ]
机构
[1] Russian Acad Sci, Inst Gen Phys, Moscow 117942, Russia
关键词
D O I
10.1070/QE1997v027n07ABEH001013
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An interferometric method was used for the first time to detect, under surface-plasmon resonance conditions, phase changes in a reflected beam caused by changes in the refractive index of the medium being diagnosed. The threshold of the sensitivity to changes in the refractive index was estimated to be 4 x 10(-8). The proposed interferometer can be used successfully in bio and chemical-sensor systems.
引用
收藏
页码:653 / 654
页数:2
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