Determination of partial pair distribution functions in amorphous Ge15Te85 by simultaneous RMC simulation of diffraction and EXAFS data

被引：28

作者：

Kaban, I. ^{[1
]}

Jovari, P.

Hoyer, W.

Welter, E.

机构：

[1] Tech Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany

[2] Res Inst Solid State Phys & Opt, H-1525 Budapest, Hungary

[3] DESY, HASYLAB, D-22603 Hamburg, Germany

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 2007年 / 353卷 / 24-25期

基金：

匈牙利科学研究基金会;

关键词：

neutron diffraction/scattering; x-ray diffraction; chalcogenides; Monte Carlo simulations; short-range order;

D O I：

10.1016/j.jnoncrysol.2006.09.072

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The atomic structure of amorphous Ge15Te85 has been studied by X-ray absorption spectroscopy (EXAFS) at Ge K-edge. EXAFS data were modeled simultaneously with existing X-ray and neutron diffraction measurements by the reverse Monte Carlo (RMC) simulation technique. Combination of the three independent measurements allowed separation of the partial pair correlation functions g(GeTe)(r) and g(TeTe)(r) and estimation of the corresponding coordination numbers. (C) 2007 Elsevier B.V. All rights reserved.

引用

页码：2474 / 2478

页数：5

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