Fourier transform infrared microscopy: some advances in techniques for characterisation and structure-property elucidations of industrial material

被引:33
作者
Chalmers, JM
Everall, NJ
Hewitson, K
Chesters, MA
Pearson, M
Grady, A
Ruzicka, B
机构
[1] ICI Technol, Wilton Res Ctr, Middlesbrough TS90 8JE, Cleveland, England
[2] Univ Nottingham, Dept Chem, Nottingham NG7 2RD, England
[3] Biorad Labs Ltd, Hemel Hempstead HP2 7TD, Herts, England
[4] SERC, Daresbury Lab, CCLRC, Warrington WA4 4AD, Cheshire, England
关键词
Fourier transform infrared-microscopy; specular reflectance; infrared imaging; synchrotron radiation; polymers;
D O I
10.1039/a707070e
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
FTIR-microscopy has become one of the foremost vibrational spectroscopy techniques for problem-solving and analysing and mapping the chemical structure and physical characteristics associated with industrial materials and their fabricated products. Many recent advances have utilised the attributes of reflection techniques, such as specular reflection spectroscopy approaches, while emerging capabilities becoming available to the industrial spectroscopist include both spectral imaging and use of synchrotron radiation as a source. This paper seeks to illustrate each of these recent advances and developments through applications of FTIR-microscopy to industrial problem-solving case studies.
引用
收藏
页码:579 / 586
页数:8
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