Software calibration of the multifringe pattern analysis of circular zone plates

被引：3

作者：

Pegna, J

Hilaire, TP

Nagy, G

机构：

[1] RENSSELAER POLYTECH INST,DEPT ELECT & COMP SYST ENGN,TROY,NY 12180

[2] RENAULT,DIRECT RECH,F-92500 RUEIL MALMAISON,FRANCE

来源：

APPLIED OPTICS | 1997年 / 36卷 / 32期

关键词：

image processing; pattern recognition; image understanding; fringe pattern analysis; circular zone plate; image metrology; interferometry; precision engineering;

D O I：

10.1364/AO.36.008370

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The linearized perturbation method for fringe pattern analysis and its extension to multifringe analysis have been recently introduced [Hilaire, Ph.D. dissertation (Rensselaer Polytechnic Institute, Troy, N.Y., 1993)]. For isolating the error component that is due to information processing-as opposed to image-acquisition errors-experimental calibration experiments were conducted by use of computer-generated fringe patterns. The effects of noise, fringe completeness, image resolution, illumination, quantization, and displacement magnitude are tested and discussed in evaluating the software's performance and accuracy. (C) 1997 Optical Society of America.

引用

页码：8370 / 8380

页数：11

共 13 条

[1]

[Anonymous], 1993, INTERFEROGRAM ANAL

[2]

Carre P., 1966, METROLOGIA, V2, P13, DOI DOI 10.1088/0026-1394/2/1/005

[3]

GUO C, 1997, THESIS RENSSELAER PO

[4]

HILAIRE TP, IN PRESS J ELECT IMA

[5]

HILAIRE TP, 1993, THESIS RENSSELAER PO

[6]

HILAIRE TP, 1995, P S MECH MAN METR ER, P495

[7]

HIRAOGLU M, 1992, THESIS RENSSELAER PO

[8]

Parker J, 1983, IEEE Trans Med Imaging, V2, P31, DOI 10.1109/TMI.1983.4307610

[9]

PEGNA J, 1995, P 95 DES TECHN ENG C

[10]

PEGNA J, 1996, COMPUTER AIDED TOLER, P283

← 1 2 →