Commonly observed degradation in field-aged photovoltaic modules

被引:201
作者
Quintana, MA
King, DL
McMahon, TJ
Osterwald, CR
机构
来源
CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002 | 2002年
关键词
D O I
10.1109/PVSC.2002.1190879
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Degradation leading to failure in photovoltaic modules follows a progression that is dependent on multiple factors, some of which interact causing degradation that is difficult to simulate in the, lab. This paper defines recently observed degradation in field-aged modules, including degradation of packaging materials, adhesional loss, degradation of interconnects, degradation due to moisture intrusion, and semiconductor device degradation. Additionally, this paper suggests that the onset And progression of degradation need to be studied to gain a more. comprehensive understanding of module degradation fates and module failures.
引用
收藏
页码:1436 / 1439
页数:4
相关论文
共 16 条
[1]  
BEMREUTER J, 2001, PHOTON INT JUN, P16
[2]  
Dhere N.G., 2001, 17 EUR PHOT SOL EN C
[3]  
DHERE NG, 2000, 16 EUR PHOT SOL EN C
[4]  
King DL, 2000, PROG PHOTOVOLTAICS, V8, P241, DOI 10.1002/(SICI)1099-159X(200003/04)8:2<241::AID-PIP290>3.0.CO
[5]  
2-D
[6]  
KING DL, 28 IEEE PVSC 2000, P1446
[7]  
OSTERWALD CR, UNPUB SOLAR ENERGY M
[8]  
OSTERWALD CR, 2002, 29 IEEE PVSC
[9]   Diagnostic analysis of silicon photovoltaic modules after 20-year field exposure [J].
Quintana, MA ;
King, DL ;
Hosking, FM ;
Kratochvil, JA ;
Johnson, RW ;
Hansen, BR ;
Dhere, NG ;
Pandit, MB .
CONFERENCE RECORD OF THE TWENTY-EIGHTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2000, 2000, :1420-1423
[10]  
ROSS RG, 1984, 17 IEEE PVSC