Structural characterization of Nb-TiO2 nanosized thick-films for gas sensing application

被引：76

作者：

Ferroni, M

Carotta, MC

Guidi, V

Martinelli, G

Ronconi, F

Richard, O

Van Dyck, D

Van Landuyt, J

机构：

[1] Univ Ferrara, Dept Phys, I-44100 Ferrara, Italy

[2] Univ Ferrara, INFM, I-44100 Ferrara, Italy

[3] Univ Antwerp, Electron Microscopy Mat Res, B-2020 Antwerp, Belgium

来源：

SENSORS AND ACTUATORS B-CHEMICAL | 2000年 / 68卷 / 1-3期

关键词：

thick film; TiO2; gas-sensor; electron microscopy; differential thermal analysis;

D O I：

10.1016/S0925-4005(00)00474-3

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Pure and Nb-doped TiO2 thick-films were prepared by screen-printing, starting from nanosized powders. Grain growth and crystalline phase modification occurred as consequence of firing at high temperature. It has been shown that niobium addition inhibits grain coarsening and hinders anatase-to-rutile phase transition. These semiconducting films exhibited n-type behavior, while Nb acted as donor-dopant. Gas measurements demonstrated that the films are suitable for CO or NO2 sensing. Microstructural characterization by electron microscopy and differential thermal analysis (DTA) highlights the dependence of gas-sensing behavior on film's properties. (C) 2000 Elsevier Science S.A. All rights reserved.

引用

页码：140 / 145

页数：6

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