Fundamental investigations of micromachining by nano- and picosecond laser radiation

被引:73
作者
Jandeleit, J [1 ]
Horn, A [1 ]
Weichenhain, R [1 ]
Kreutz, EW [1 ]
Poprawe, R [1 ]
机构
[1] RWTH Aachen, Lehrstuhl Lasertech, D-52074 Aachen, Germany
关键词
material removal; micromachining; picosecond laser pulses; nanosecond laser pulses;
D O I
10.1016/S0169-4332(97)00762-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The removal processes of ceramics and metals were investigated using pico-and nanosecond laser radiation produced by diode-pumped Nd:YAG lasers. The laser radiation was focused to spot diameters smaller than 10 mu m, yielding power densities up to 5 X 10(12) W/cm(2). The threshold fluence for removal and the removal depth per pulse were determined for 40 pico- and 10 nanosecond laser pulses using the fundamental wavelength, the second harmonic and the third harmonic laser radiation of the laser system. For 40 ps laser pulses pump and probe investigations were used to study the interaction of intense ultrashort laser beams with matter. By this technique ultrashort processes can be photographed with a time resolution determined by the pulse length of pump and probe pulses. The measurements allow a detailed characterization of the material removal including melting, vaporization and fast resolidification as well as the feedback of the surrounding atmosphere to the processed microstructures. The threshold fluences for material removal and the removal rates per pulse were determined for Si(3)N(4), SiC and WC as a function of laser pulse length and laser wavelength. Using picosecond laser radiation microstructures were produced in different ceramics and metals demonstrating the suitability of short laser pulses for the production of microstructures with dimensions smaller than 10 mu m and for ultra-precise removal of thin layers. (C) 1998 Elsevier Science B.V.
引用
收藏
页码:885 / 891
页数:7
相关论文
共 10 条
[1]   ABLATION OF METAL-FILMS BY PICOSECOND LASER-PULSES IMAGED WITH HIGH-SPEED ELECTRON-MICROSCOPY [J].
BOSTANJOGLO, O ;
NIEDRIG, R ;
WEDEL, B .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (05) :3045-3048
[2]  
HOFFMANN HD, 1996, P LAS 95, P253
[3]   Picosecond laser ablation of thin copper films [J].
Jandeleit, J ;
Urbasch, G ;
Hoffmann, HD ;
Treusch, HG ;
Kreutz, EW .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1996, 63 (02) :117-121
[4]  
JANDELEIT J, 1997, P ICALEO 96 A, V51, P83
[5]  
MACDONALD CA, 1986, MATER RES SOC S P, V51, P277
[6]  
Maher WE, 1995, P LASER INS, V80, P808
[7]   ELECTRON AND ION EMISSION IN HIGH-INTENSITY LASER IRRADIATION OF ALUMINUM [J].
MARTIN, P ;
TRAINHAM, R ;
AGOSTINI, P ;
PETITE, G .
PHYSICAL REVIEW B, 1992, 45 (01) :69-77
[8]  
MENZ W, 1993, MIKROSYSTEMTECHNIK I
[9]   MEASUREMENT OF MU-M SIZED RADIUS OF GAUSSIAN LASER-BEAM USING SCANNING KNIFE-EDGE [J].
SUZAKI, Y ;
TACHIBANA, A .
APPLIED OPTICS, 1975, 14 (12) :2809-2810
[10]  
ZELDOVICH YB, 1967, PHYSICS SHOCK WAVES