Characterization of Ag-doped vanadium oxide (AgxV2O5) thin film for cathode of thin film battery

被引：37

作者：

Hwang, HS

Oh, SH

Kim, HS

Cho, WI ^{[1
]}

Cho, BW

Lee, DY

机构：

[1] Korea Inst Sci & Technol, Econano Res Ctr, Seoul 130650, South Korea

[2] Korea Univ, Div MSE, Seoul 136701, South Korea

来源：

ELECTROCHIMICA ACTA | 2004年 / 50卷 / 2-3期

关键词：

silver co-sputtering; amorphous vanadium oxide; cathode; thin film battery;

D O I：

10.1016/j.electacta.2004.04.050

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The effect of silver co-sputtering on the characteristics of amorphous V2O5 films, grown by dc reactive sputtering, is investigated. The co-sputtering process influences the growth mechanism as well as the characteristics of the V2O5 films. X-ray diffraction (XRD), Inductively coupled plasma-atomic emission spectrometry (ICP-AES), field emission-scanning electron microscopy (FE-SEM), Fourier transform infrared spectrometry (FT-IR) and X-ray photoelectron spectrometry (XPS) results indicate that the microstructure of the V2O5 films is affected by the rf power of the co-sputtered silver. In addition, an all-solid-state thin film battery with full cell structure of Li/LiPON/AgxV2O5/Pt has been fabricated. It is found that the silver co-sputtered V2O5 cathode film exhibits better cycle performance than an undoped one. (C) 2004 Elsevier Ltd. All rights reserved.

引用

页码：485 / 489

页数：5

共 15 条

[1]

BATES JB, 1993, SOLID STATE TECHNOL, V36, P59

[2] STRUCTURAL, ELECTRICAL AND OPTICAL-PROPERTIES OF SPUTTERED VANADIUM PENTOXIDE THIN-FILMS [J].