An anti-reflection coating for silicon optics at terahertz frequencies

被引:123
作者
Gatesman, AJ [1 ]
Waldman, J
Ji, M
Musante, C
Yngvesson, S
机构
[1] Univ Lowell, Submillimeter Wave Technol Lab, Lowell, MA 01854 USA
[2] Univ Massachusetts, Dept Elect & Comp Engn, Amherst, MA 01003 USA
来源
IEEE MICROWAVE AND GUIDED WAVE LETTERS | 2000年 / 10卷 / 07期
关键词
anti-reflection; parylene; silicon; terahertz;
D O I
10.1109/75.856983
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A method for reducing the reflections from silicon optics at terahertz frequencies has been investigated. In this study, we used thin films of parylene as an anti-reflection (AR) layer for silicon optics and show low-loss behavior well above 1 THz. Transmittance spectra are acquired on double-sided-parylene-coated, high-resistivity, single-crystal silicon etalons between 0.45 THz and 2.8 THz. Modeling the optical behavior of the three-layer system allowed fur the determination of the refractive index and absorption coefficient of parylene at these frequencies. Our data indicate a refractive index, n, of 1.62 for parylene C and parylene D, and a reasonably modest absorption coefficient make these materials a suitable AR coating for silicon at terahertz frequencies. Coatings sufficiently thick for AR performance reduced the average transmittance of the three-layer system by <10% compared to a lossless AR coating with an ideal refractive index.
引用
收藏
页码:264 / 266
页数:3
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