Random and systematic uncertainties of reflection-type Q-factor measurement with network analyzer

被引:24
作者
Kajfez, D [1 ]
机构
[1] Univ Mississippi, Dept Elect Engn, University, MS 38677 USA
关键词
cavity resonators; measurement uncertainties; network analyzers; Q-factor measurement;
D O I
10.1109/TMTT.2002.807831
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The reflection-type measurement of the unloaded Q factor of microwave resonant cavities consists of measuring the complex reflection coefficient with a network analyzer as a function of frequency and fitting the measured data to a circle on a complex plane. The measurement errors are of two kinds: random errors caused by imperfect data fit to an ideal circle and systematic errors caused by the limited accuracy of the network analyzer and its accessories. This paper presents the methods for estimating the measurement uncertainties for both kinds of errors.
引用
收藏
页码:512 / 519
页数:8
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