Galvanomagnetic properties of Hg1-xMnxTe1-ySey semimagnetic semiconductors

被引:3
作者
Kul'bachinskii, VA [1 ]
Churilov, IA [1 ]
Mar'yanchuk, PD [1 ]
Lunin, RA [1 ]
机构
[1] Moscow MV Lomonosov State Univ, Moscow 119899, Russia
关键词
D O I
10.1134/1.558405
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The galvanomagnetic properties of single crystals of the semimagnetic semiconductors Hg1-xMnxTe1-ySey with 0.01<y <0.1 and x=0.05 and 0.14 in the temperature range 4.2-300 K are investigated. The features of the temperature dependence of the Hall coefficient R-H and the complicated behavior of R-H in a magnetic field are attributed quantitatively to the existence of three groups of current carriers, viz., electrons and two types of holes, for which the temperature dependences of the densities and mobilities are obtained. A transition from p-type to n-type conductivity is observed as the Se content is increased, and the negative magnetoresistance simultaneously gives way to positive magnetoresistance. (C) 1997 American Institute of Physics.
引用
收藏
页码:989 / 993
页数:5
相关论文
共 16 条
[1]   DETERMINATION OF ELECTRICAL TRANSPORT-PROPERTIES USING A NOVEL MAGNETIC FIELD-DEPENDENT HALL TECHNIQUE [J].
BECK, WA ;
ANDERSON, JR .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (02) :541-544
[2]  
BRANDT NB, 1984, ADV PHYS, V33, P194
[3]  
BRANDT NB, 1983, ZH EKSP TEOR FIZ, V57, P614
[4]   PECULIARITIES OF THE MAGNETORESISTANCE OF HG1-XMNXTE [J].
DAVYDOV, AB ;
PONIKAROV, BB ;
TSIDILKOVSKII, IM .
PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1980, 101 (01) :127-134
[5]  
FURDYNA JK, 1988, J APPL PHYS, V64, pR29
[6]  
GAWRON LR, 1982, LECT NOTE PHYS, V152, P294
[7]  
ISMAILOV ZT, 1988, SOV PHYS SEMICOND+, V22, P231
[8]   TRANSPORT ANOMALIES IN CDXHG1-XTE [J].
IVANOVOMSKII, VI ;
BERCHENKO, NN ;
ELIZAROV, AI .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1987, 103 (01) :11-28
[9]   TRANSPORT MEASUREMENTS ON POSITIVE-GAP HG1-XMNXTE WITH THE USE OF AN ALTERNATING-CURRENT TECHNIQUE [J].
JOHNSON, WB ;
ANDERSON, JR ;
STONE, DR .
PHYSICAL REVIEW B, 1984, 29 (12) :6679-6686
[10]  
KRYLOV KR, 1994, SEMICONDUCTORS+, V28, P779