共 16 条
- [1] Another dimension in device characterization [J]. IEEE CIRCUITS & DEVICES, 2000, 16 (02): : 12 - 18
- [3] BRESELGE M, 2005, THIN SOLID FILMS
- [6] Comparison of two-dimensional carrier profiles in metal-oxide-semiconductor field-effect transistor structures obtained with scanning spreading resistance microscopy and inverse modeling [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (01): : 540 - 544
- [7] Kelvin probe force microscopy study of conjugated polymer/fullerene organic solar cells [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (7B): : 5370 - 5373
- [9] Lampert M. A., 1970, CURRENT INJECTION SO