High resolution electrical characterisation of organic photovoltaic blends

被引:18
作者
Douheret, O.
Swinnen, A.
Breselge, M.
Van Severen, I.
Lutsen, L.
Vanderzande, D.
Manca, J.
机构
[1] IMEC, Div IMOMEC, B-3590 Diepenbeek, Belgium
[2] Hasselt Univ, Mat Res Inst, B-3590 Diepenbeek, Belgium
关键词
D O I
10.1016/j.mee.2006.10.056
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work, electrostatic force microscopy (EFM) and conductive atomic force microscopy (C-AFM) are applied to perform high-resolution electrical characterisation of organic photovoltaic films. These films are composed of the C-60-derivative PCBM blended with hole conductive conjugated polymers PPV derivatives or P3HT. It is demonstrated that both EFNI and C-AFM are able to electrically evidence phase separation in the blends, suggesting in addition higher density of carriers along interfaces. Correlation between the EFM contrast and the photovoltaic properties of the blends was observed. Local spectroscopy (I- V curves) completes the C-AFM investigations, analysing charge transport mechanisms in the P3HT:PCBM blend. Significant modifications of the local electrical properties of P3HT are shown to occur upon blending. Space charge limited current is evidenced in the blend and a hole mobility of 1.7 x 10(-2) cm(2) V-1 S-1 is determined for P3HT. (c) 2006 Elsevier BN. All rights reserved.
引用
收藏
页码:431 / 436
页数:6
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