Angle-resolved photoemission spectroscopy and imaging with a submicrometre probe at the SPECTROMICROSCOPY-3.2L beamline of Elettra

被引：108

作者：

Dudin, Pavel ^{[1
]}

Lacovig, Paolo ^{[1
]}

Fava, Claudio ^{[1
]}

Nicolini, Eugenio ^{[1
]}

Bianco, Anna ^{[1
]}

Cautero, Giuseppe ^{[1
]}

Barinov, Alexei ^{[1
]}

机构：

[1] Elettra Sincrotrone Trieste ScPA, I-34149 Trieste, Italy

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2010年 / 17卷

关键词：

beamlines and optics; scanning microscopy; angle-resolved photoemission; graphite; band structure; DEFECTS;

D O I：

10.1107/S0909049510013993

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The extensive upgrade of the experimental end-station of the SPECTROMICROSCOPY- 3.2L beamline at Elettra synchrotron light source is reported. After the upgrade, angle-resolved photoemission spectroscopy from a submicrometre spot and scanning microscopy images monitoring the photoelectron signal inside selected acquisition angle and energy windows can be performed. As a test case, angle-resolved photoemission spectroscopy from single flakes of highly oriented pyrolitic graphite and imaging of the flakes with image contrast owing to rotation of the band dispersion of different flakes are presented.

引用

页码：445 / 450

页数：6

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