High-precision ionization chamber for relative intensity monitoring of synchrotron radiation

被引：4

作者：

Ahmed, SN

Besch, HJ

Walenta, AH

Pavel, N

Schenk, W

机构：

[1] Univ Siegen, Fachbereich Phys, D-57068 Siegen, Germany

[2] MPI Phys, Munich, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2000年 / 449卷 / 1-2期

关键词：

radiation detector; synchrotron radiation; EXAFS; X-rays; beam-monitor;

D O I：

10.1016/S0168-9002(99)01385-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A single channel, high-precision ionization chamber has been built for monitoring the relative intensity of X-rays in the energy range above 5 keV. It can be used in experiments, such as EXAFS, where simultaneous high-precision monitoring of the relative intensity during the actual experiment is required. In this paper the construction of the chamber and its performance during test measurements with an X-ray tube are presented. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：248 / 253

页数：6