Depth profiling of a single crystal of YBCO superconductor using micro-PIXE technique

Elemental depth profiling of a small single crystal (1.5 mm x 1.3 mm x 0.1 mm) of a YBCO superconductor was carried out non-destructively by scanning its thickness with a proton microbeam, and analyzing the characteristic Xrays produced (the micro-PIXE technique). Elemental composition spectra, two-dimensional elemental distribution maps, and one-dimensional line scan spectra from several parts of the thickness were acquired. The results are discussed in the light of the method used for growing the crystal and on the basis of the electronic structure theory of the high-T-c superconducting compounds. (C) 1997 Elsevier Science B.V.