Substrate temperature dependent structural, optical and electrical properties of spray deposited iridium oxide thin films

被引:78
作者
Kawar, RK [1 ]
Chigare, PS [1 ]
Patil, PS [1 ]
机构
[1] Shivaji Univ, Dept Phys, Thin Films Phys Lab, Kolhapur 416004, Maharashtra, India
关键词
spray pyrolysis technique (SPT); iridium oxide thin films; characterisation; X-ray diffraction;
D O I
10.1016/S0169-4332(02)01191-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Iridium oxide thin films were deposited onto the glass substrates by spray pyrolysis technique (SPT) using aqueous solution of IrCl3.3H(2)O at various substrate (deposition) temperatures ranging from 250 to 400 degreesC. Emission of both physisorbed and chemisorbed water takes place during thermal decomposition process and Ir2O3 forms below 600 degreesC, above which dehydrated IrO2 formation takes place. The as-deposited samples at all substrate temperatures were X-ray amorphous and those annealed at 600 degreesC for 3 h in milieu of air were polycrystalline tetragonal IrO2. The infrared (IR) and Raman spectroscopic results echo above findings. The optical and electrical characteristics reveal that optical transition takes place through d-d intraband excitation and p-type semiconductor to metallic transition at 600 degreesC. The semiconducting to metal transitions in iridium oxide thin films were discussed on the basis of Anderson's theory. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:90 / 101
页数:12
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