Crystal orientation measured by XRD and annotation of the butterfly diagram

被引：43

作者：

Guo, ZQ ^{[1
]}

Fu, T

Fu, HZ

机构：

[1] NW Univ Xian, Inst Analyt Chem, Xian 710069, Peoples R China

[2] Xian Jiao Tong Univ, State Key Lab Mech Behav Mat, Xian 710049, Peoples R China

[3] Northwestern Polytech Univ, State Key Lab Solidificat Proc, Xian 710072, Peoples R China

来源：

MATERIALS CHARACTERIZATION | 2000年 / 44卷 / 4-5期

关键词：

Butterfly diagrams;

D O I：

10.1016/S1044-5803(00)00084-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An improved X-ray diffraction rotating orientation measurement method is proposed that can measure the crystal lattice orientation quickly and accurately. The method can also directly assess the quality of preferentially oriented specimens and quasi-single crystals through use of the butterfly diagram to measure the crystal orientation distribution. (C) Elsevier Science Inc., 2000. All rights reserved.

引用

页码：431 / 434

页数：4