Change of the depth profile of a light-emitting zone in organic EL devices with their degradation

被引:23
作者
Matsumura, M [1 ]
Jinde, Y [1 ]
机构
[1] Osaka Univ, Res Ctr Photoenerget Organ Mat, Osaka 560, Japan
关键词
electroluminescence; light-emitting devices; degradation;
D O I
10.1016/S0379-6779(97)04009-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The light-emitting zone in organic electroluminescent (EL) devices having the aluminum-hydroxyquinoline complex (ALQ)/diamine (TPD) junction was estimated from the analysis of the EL spectra. The zone distributed to the depth of about 20 nm from the interface at the initial performance. The zone however was found to shrink toward the ALQ/TPD interface as the devices degraded. From the results, it was concluded that the ALQ/TPD interface is responsible for the degradation, especially at the initial stage. (C) 1997 Elsevier Science S.A.
引用
收藏
页码:197 / 198
页数:2
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