Subwavelength depth resolution in near-field microscopy

被引：5

作者：

Fischer, DG ^{[1
]}

机构：

[1] NASA, Glenn Res Ctr, Natl Ctr Micrograv Res Fluids & Combust, Cleveland, OH 44135 USA

来源：

OPTICS LETTERS | 2000年 / 25卷 / 20期

关键词：

D O I：

10.1364/OL.25.001529

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A generalized Radon transform is presented that relates, for the case of an evanescent wave that is incident upon a weakly scattering medium, the homogeneous components of the scattered field to the three-dimensional Fourier transform of the dielectric susceptibility. This relationship is used within the context of total internal reflection microscopy to reconstruct the depth structure of the dielectric susceptibility from simulated scattered field data. (C) 2000 Optical Society of America OCIS codes: 290.3200, 180.6900, 100.3010.

引用

页码：1529 / 1531

页数：3

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