Electron scattering on C6F6 and SF6 molecules

被引:39
作者
Kasperski, G [1 ]
Mozejko, P [1 ]
Szmytkowski, C [1 ]
机构
[1] Gdansk Tech Univ, Fac Appl Phys & Math, PL-80952 Gdansk, Poland
来源
ZEITSCHRIFT FUR PHYSIK D-ATOMS MOLECULES AND CLUSTERS | 1997年 / 42卷 / 03期
关键词
D O I
10.1007/s004600050353
中图分类号
O64 [物理化学(理论化学)、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号
070203 ; 070304 ; 081704 ; 1406 ;
摘要
Total absolute cross sections for electron scattering on hexafluorobenzene, C6F6, and sulfur hexafluoride, SF6, molecules, have been measured as a function of impact energy from 0.6 to 250 eV. The total cross section for C6F6 exhibits a very broad peak stretching from 10 to 100 eV with some weak features near 9.5 and 15 eV superimposed on the peak. Apart from the well-known low-energy resonant structures in the SF6 total cross section function, a new weak resonant feature close to 25 eV has been noticed in the present experiment, in accordance with earlier theoretical calculations.
引用
收藏
页码:187 / 191
页数:5
相关论文
共 40 条
[1]   TOTAL ELECTRON-ATOM COLLISION CROSS SECTIONS AT LOW ENERGIES - CRITICAL REVIEW [J].
BEDERSON, B ;
KIEFFER, LJ .
REVIEWS OF MODERN PHYSICS, 1971, 43 (04) :601-&
[2]   EFFECT OF TEMPERATURE ON THE FORMATION AND AUTODESTRUCTION OF PARENT ANIONS [J].
CHRISTOPHOROU, LG ;
DATSKOS, PG .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1995, 149 :59-77
[3]   BASIC PHYSICS OF GASEOUS DIELECTRICS [J].
CHRISTOPHOROU, LG ;
PINNADUWAGE, LA .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1990, 25 (01) :55-74
[4]   SF6/N-2 MIXTURES - BASIC AND HV INSULATION PROPERTIES [J].
CHRISTOPHOROU, LG ;
VANBRUNT, RJ .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 1995, 2 (05) :952-1003
[5]   MEASUREMENTS OF ELECTRON-ATTACHMENT LINESHAPES AND CROSS-SECTIONS AT ULTRA-LOW ELECTRON ENERGIES FOR 2-C4F8,C-C5F8,C-C6F6 AND C7F8 [J].
CHUTJIAN, A ;
ALAJAJIAN, SH .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1985, 18 (20) :4159-4167
[6]   TOTAL-CROSS-SECTION MEASUREMENTS FOR POSITRON AND ELECTRON-SCATTERING BY O-2, CH4, AND SF6 [J].
DABABNEH, MS ;
HSIEH, YF ;
KAUPPILA, WE ;
KWAN, CK ;
SMITH, SJ ;
STEIN, TS ;
UDDIN, MN .
PHYSICAL REVIEW A, 1988, 38 (03) :1207-1216
[7]   TEMPERATURE-ENHANCED ELECTRON DETACHMENT FROM C6F6- NEGATIVE-IONS [J].
DATSKOS, PG ;
CHRISTOPHOROU, LG ;
CARTER, JG .
JOURNAL OF CHEMICAL PHYSICS, 1993, 98 (10) :7875-7882
[8]   SHAPE RESONANCES IN E-SF6 SCATTERING [J].
DEHMER, JL ;
SIEGEL, J ;
DILL, D .
JOURNAL OF CHEMICAL PHYSICS, 1978, 69 (11) :5205-5206
[9]   IONIZATION AND DISSOCIATION OF HEXAFLUOROBENZENE BY ELECTRON IMPACT [J].
DIBELER, VH ;
REESE, RM ;
MOHLER, FL .
JOURNAL OF CHEMICAL PHYSICS, 1957, 26 (02) :304-305
[10]   LOW-ENERGY ELECTRON-IMPACT ON BENZENE AND THE FLUOROBENZENES - FORMATION AND DISSOCIATION OF NEGATIVE-IONS [J].
FENZLAFF, HP ;
ILLENBERGER, E .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1984, 59 (02) :185-202