Laboratory photometry of planetary regolith analogs -: II.: Surface roughness and extremes of packing density

被引:29
作者
Näränen, J
Kaasalainen, S
Peltoniemi, J
Heikkilä, S
Granvik, M
Saarinen, V
机构
[1] Finnish Geodet Inst, Dept Remote Sensing & Photogrammetry, Masala 02431, Finland
[2] Univ Helsinki, Observatory, FIN-00014 Helsinki, Finland
[3] Helsinki Univ Technol, Automat Technol Lab, Espoo 02015, Finland
[4] Helsinki Univ Technol, Lab Space Technol, Espoo 02015, Finland
关键词
planets and satellites : general; scattering; methods : laboratory;
D O I
10.1051/0004-6361:20040556
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
Laboratory phase curves of planetary regolith analog materials are presented. A study is made of the effect of compaction of the material on its backscattering properties. Further study is also made of the contribution of material surface roughness on its light scattering. First photometric light backscattering measurements in a microgravity environment are introduced as well as some improvements of the laboratory experiment techniques. The measurements show a strong increase in both reflectance and opposition effect amplitude under compaction. Also a broadening of the opposition effect width is observed. These results are in contrast with some of the previous studies on the subject. The surface roughness of a sample is found to be an important factor in measurements of samples with the same packing density. This should be taken into account in further studies.
引用
收藏
页码:1103 / 1109
页数:7
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