Conical x-ray crystal spectrometer for time integrated and time resolved measurements

被引：22

作者：

Andiel, U ^{[1
]}

Eidmann, K

Pisani, F

Witte, K

Uschmann, I

Wehrhan, O

Förster, E

机构：

[1] Max Planck Inst Quantum Opt, D-85748 Garching, Germany

[2] Univ Jena, Inst Opt & Quantenelekt, D-07743 Jena, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2003年 / 74卷 / 04期

关键词：

D O I：

10.1063/1.1556953

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present a new x-ray spectrometer setup based on a conically curved mica crystal in the von Hamos configuration. An x-ray sensitive charge coupled device or streak camera can be easily coupled in a perpendicular orientation to the spectrally resolved x-ray line focus. Shifting the crystal along its axis of symmetry allows one to change the dispersion and the signal flux density on the detector. A large spectral range at high resolution and adjustable signal intensity is accessible with this setup. (C) 2003 American Institute of Physics.

引用

页码：2369 / 2374

页数：6

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