Reduction of two-dimensional small- and wideangle X-ray scattering data

At the beamlines ID01 and ID02 of the European Synchrotron Radiation Facility in Grenoble, France, position-sensitive detectors for time-resolved small- and wide-angle X-ray scattering experiments are in use. The applied data reduction method has never been described comprehensively. This article outlines the parametrization of the raw data and introduces the programs developed for this purpose. Data reduction in the sense of this article means all steps between detector readout and normalization to absolute scattering intensities. This includes all corrections that can be made without any specific knowledge of the sample, e. g. detector dark-image correction, division by a flatfield and intensity normalization. Processed data are either two- or one-dimensional. Optionally, statistical errors can be propagated through the calculations.