On the critical point of the Random Walk Pinning Model in dimension d=3

被引:22
作者
Berger, Quentin [1 ]
Toninelli, Fabio Lucio [1 ,2 ]
机构
[1] Univ Lyon, Phys Lab, ENS Lyon, F-69364 Lyon, France
[2] Univ Lyon, CNRS, F-69364 Lyon, France
来源
ELECTRONIC JOURNAL OF PROBABILITY | 2010年 / 15卷
基金
欧洲研究理事会;
关键词
Pinning Models; Random Walk; Fractional Moment Method; Marginal Disorder;
D O I
10.1214/EJP.v15-761
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
We consider the Random Walk Pinning Model studied in [3] and [2]: this is a random walk X on Z(d), whose law is modified by the exponential of beta times L-N (X, Y), the collision local time up to time N with the (quenched) trajectory Y of another d-dimensional random walk. If beta exceeds a certain critical value beta(c), the two walks stick together for typical Y realizations (localized phase). A natural question is whether the disorder is relevant or not, that is whether the quenched and annealed systems have the same critical behavior. Birkner and Sun [3] proved that beta(c) coincides with the critical point of the annealed Random Walk Pinning Model if the space dimension is d = 1 or d = 2, and that it differs from it in dimension d >= 4 (for d >= 5, the result was proven also in [2]). Here, we consider the open case of the marginal dimension d = 3, and we prove non-coincidence of the critical points.
引用
收藏
页码:654 / 683
页数:30
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