Fabrication technology of ferroelectric memories

被引:31
作者
Nakamura, T [1 ]
Fujimori, Y [1 ]
Izumi, N [1 ]
Kamisawa, A [1 ]
机构
[1] Rohm & Haas Co, Ukyo Ku, Kyoto 615, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1998年 / 37卷 / 3B期
关键词
ferroelectric memory; Ir based electrode; fatigue and imprint characteristics; Pb(Zi; Ti)O-3 on poly-Si;
D O I
10.1143/JJAP.37.1325
中图分类号
O59 [应用物理学];
学科分类号
摘要
Two types of ferroelectric memories have been proposed. One is a 1 transistor and 1 capacitor (1T1C) type and another is an FET (field effect transistor) type. The fabrication technique for fabrication ferroelectric capacitors on polycrystalline Si (poly-Si) was very effective for high density 1T1C ferroelectric memory and metal-ferroelectric-metal-insulator-semiconductor (MFMIS) FET with stable properties. MFMIS FET is one type of FET ferroelectric memory which we proposed. To obtain good ferroelectric capacitors on poly-Si, we used Ir based materials as electrodes of the capacitors. By using Ir based electrodes, the characteristics of Pb(Zi,Ti)O-3 (PZT) capacitors on poly-Si were equivalent to those on SiO2. Moreover, the PZT capacitors with Ir based electrodes showed dramatic improvement in fatigue and imprint properties.
引用
收藏
页码:1325 / 1327
页数:3
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