Trapping of excitons at chemical defects in polyethylene

被引:41
作者
Ceresoli, D
Tosatti, E
Scandolo, S
Santoro, G
Serra, S
机构
[1] Scuola Int Super Studi Avanzati, I-34014 Trieste, Italy
[2] DEMOCRITOS INFM, Natl Simulat Ctr, Trieste, Italy
[3] Abdus Salaam Int Ctr Theoret Phys, I-34100 Trieste, Italy
[4] Pirelli Labs Mat Innovat, I-20126 Milan, Italy
关键词
D O I
10.1063/1.1783876
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In a previous paper we studied an injected electron-hole pair in crystalline polyethylene (PE) and found that the exciton becomes weakly self-trapped in a narrow interchain pocket comprised between two gauche defects. Despite the large energy stored in the trapped excitation, there did not appear to be a direct nonradiative channel for electron-hole recombination. Actual polyethylene systems of practical use are, however, neither crystalline nor pure. To understand the fate of an electron-hole pair in the impure case, we studied by ab initio simulations the evolution of an exciton trapped on three common chemical defects found in polyethylene: a grafted carbonyl (C=O); an intrachain vinyl group (C=C); a grafted carboxyl (COOH). Ab initio simulations lead to predict three different outcomes: trapping, nonradiative recombination, and homolitic bond-breaking, respectively. This suggests that extrinsic self-trapping of electron-hole pairs over chemical defects inside the quasicrystalline fraction of PE could be relevant for electrical damage in high-voltage cables. (C) 2004 American Institute of Physics.
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页码:6478 / 6484
页数:7
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