Cooperative upconversion and optical gain in ion-beam sputter-deposited ErxY2-xSiO5 waveguides

被引:53
作者
Suh, Kiseok [1 ]
Lee, Minkyung [1 ]
Chang, Jee Soo [1 ]
Lee, Hansuek [3 ]
Park, Namkyoo [3 ]
Sung, Gun Yong [4 ]
Shin, Jung H. [1 ,2 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Phys, Taejon 305701, South Korea
[2] Korea Adv Inst Sci & Technol, Grad Sch Nanosci & Technol WCU, Taejon 305701, South Korea
[3] Seoul Natl Univ, Sch Elect Engn & Comp Sci, Opt Commun Syst Lab, Seoul 151744, South Korea
[4] ETRI, Biosensor Res Team, Taejon 305700, South Korea
来源
OPTICS EXPRESS | 2010年 / 18卷 / 08期
关键词
ERBIUM; SILICATE;
D O I
10.1364/OE.18.007724
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Single-phase, polycrystalline ErxY2-xSiO5 thin films were deposited by reactive ion-beam sputter deposition and rapid thermal annealing. Due to the crystalline nature, the silicate thin films provide peak Er3+ emission cross-section of 0.9 +/- 0.02 x 10(-20) cm(2) that is higher than that in silica. Optical gain, with near 60% inversion, is achieved via optical pumping of a single-mode, ridge-type waveguide with the silicate core with an Er concentration of 1.7 x 10(20) cm(-3). Analysis of pump-power dependence of the optical gain and spontaneous emission intensity of Er3+ indicate that the gain is limited by cooperative upconversion process, whose coefficient is determined to be (8 +/- 3) x 10(-17) cm(3)/sec. (C) 2010 Optical Society of America
引用
收藏
页码:7724 / 7731
页数:8
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