Effects of post-annealing on thermoelectric properties of p-type CoSb3 grown by the vertical Bridgman method

被引:17
作者
Akasaka, A
Iida, T
Sakuragi, G
Furuyama, S
Noda, A
Matsui, S
Ota, M
Suzuki, H
Sato, H
Takanashi, Y
Sakuragi, S
机构
[1] Sci Univ Tokyo, Dept Mat Sci & Technol, Noda, Chiba 2788510, Japan
[2] Union Mat Inc, Ibaraki 3001602, Japan
关键词
semiconductor; crystal growth; CoSb3; Skutterudite; thermoelectric material;
D O I
10.1016/j.jallcom.2004.04.144
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Crystals of CoSb3, a peritectic skutterudite compound, were grown by the vertical Bridgman method at various growth speeds ranging from 0.4 to 2.8 mm/h. Changes in the growth parameters resulted in the formation of polycrystalline p-type CoSb3 grains surrounded by Sb metal. To remove the excess Sb in the as-grown crystals, post-annealing was performed. Removing the residual Sb through the post-annealing process caused reconstruction of CoSb3 grain externals and formation of voids in the crystals, resulting in an increase in the Seebeck coefficient from around 40 muV/K (in as-grown samples) to 250-500 muV/K. The increased Seebeck coefficient values of the post-annealed samples are higher than that of single-crystal bulk CoSb3 with the corresponding carrier concentration. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:228 / 233
页数:6
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