The importance of measurement accuracy in statistical process control

被引:11
作者
Askary, F [1 ]
Sullivan, NT [1 ]
机构
[1] MetroBoost, Santa Clara, CA 95051 USA
来源
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XIV | 2000年 / 3998卷
关键词
Accuracy; Statistical Process Control (SPC); precision; Critical Dimension (CD) measurements;
D O I
10.1117/12.386462
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Precision is deemed the most important aspect of a measurement for process control. This paper discusses the role of accuracy in process control and product quality. Although the discussion is emphasized for CD SEM metrology systems, the idea can be extended to other metrology areas such as thickness measurement where in addition to thickness, material characteristics also play a role. In 1999, the characteristics of accuracy were published in a landmark paper(1). The authors introduced the concept of characteristic slope and offset for the purpose of tool evaluation. Slope and offset were obtained from correlation plots of a measurement tool under test with a reference measurement system. The measurands were features that represent the range of process variations in a line. This paper builds on the ideas put forth in that reference(1) and discusses the impact of measurement accuracy on process control. First, the issue is considered in an abstract sense, by comparison of the measurement method under test to a standard reference method. Then practical implications are discussed in more detail when tools from different suppliers are used in a fab to manufacture products.
引用
收藏
页码:546 / 554
页数:9
相关论文
共 3 条
[1]  
BANKE B, 1999, SPIE, V3667, P291
[2]  
ENGELEN A, 1999, SPIE, V3667, P280
[3]  
Mandel J., 2012, The Statistical Analysis of Experimental Data