Dielectric relaxation and strain behavior of 95.5% Pb(Zn1/3Nb2/3)O3-4.5% PbTiO3 single crystals at cryogenic temperatures

被引:20
作者
Yu, Z [1 ]
Ang, C
Furman, E
Cross, LE
机构
[1] Penn State Univ, Mat Res Lab, University Pk, PA 16802 USA
[2] Univ Akron, Dept Phys, Akron, OH 44325 USA
关键词
D O I
10.1063/1.1541936
中图分类号
O59 [应用物理学];
学科分类号
摘要
The dielectric behavior of 95.5% Pb(Zn1/3Nb2/3)O-3-4.5% PbTiO3 single crystals oriented along <001> direction with and without dc electric field has been studied at cryogenic temperatures. A pronounced low-temperature dielectric relaxation process was observed below 200 K; the relaxation rate follows the Arrhenius law (tau(0)=similar to1.0x10(-15) s and U=0.24 eV). An additional dielectric anomaly showed up around 250 K at 10 kHz under a dc electric field. These results indicate rather complicated polarization mechanisms at cryogenic temperatures which clearly need more detailed study. The strain levels at cryogenic temperatures suggest that this material is very promising for space applications, in which the performance at cryogenic temperatures is critical. (C) 2003 American Institute of Physics.
引用
收藏
页码:790 / 792
页数:3
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