Phase-field modeling of microvoid evolution under elastic-plastic deformation

被引：20

作者：

Hu, S. Y. ^{[1
]}

Baskes, M. I. ^{[1
]}

Stan, M. ^{[1
]}

机构：

[1] Los Alamos Natl Lab, Los Alamos, NM 87545 USA

来源：

APPLIED PHYSICS LETTERS | 2007年 / 90卷 / 08期

关键词：

D O I：

10.1063/1.2709908

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Plastic deformation reduces the local stress concentration and changes the interface coherency in a coherent microstructure. Therefore, it may affect the morphology and evolution kinetics of a microstructure. In this work, a very efficient method has been proposed to obtain the elastic-plastic solution in an elastically inhomogeneous solid. A phase-field model integrating this method has been developed to study the microvoid evolution with vacancy diffusion under elastic-plastic deformation. It is able to demonstrate the formation of slip bands around voids and to predict the effect of plastic deformations and the elastic interaction between vacancy diffusion and deformation on the void evolution and stress-strain curves. (c) 2007 American Institute of Physics.

引用

页数：3

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