Intrinsic hole mobility and trapping in a regioregular poly(thiophene) -: art. no. 115311

被引:206
作者
Salleo, A
Chen, TW
Völkel, AR
Wu, Y
Liu, P
Ong, BS
Street, RA
机构
[1] Xerox Corp, Palo Alto Res Ctr, Palo Alto, CA 94304 USA
[2] Xerox Res Ctr Canada Ltd, Mat Design & Integrat Lab, Mississauga, ON L5K 2L1, Canada
关键词
D O I
10.1103/PhysRevB.70.115311
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The transport properties of high-performance thin-film transistors (TFT) made with a regioregularpoly(thiophene) semiconductor (PQT-12) are reported. The room-temperature field-effect mobility of the devices varied between 0.004 and 0.1 cm(2)/V s and was controlled through thermal processing of the material, which modified the structural order. The transport properties of TFTs were studied as a function of temperature. The field-effect mobility is thermally activated in all films at T<200 K and the activation energy depends on the charge density in the channel. The experimental data are compared to theoretical models for transport, and we argue that a model based on the existence of a mobility edge and an exponential distribution of traps provides the best interpretation of the data. The differences in room-temperature mobility are attributed to different widths of the shallow localized state distribution at the edge of the valence band due to structural disorder in the film. The free carrier mobility of the mobile states in the ordered regions of the film is the same in all structural modifications and is estimated to be between 1 and 4 cm(2)/V s.
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页码:115311 / 1
页数:10
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