机构:
Toshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, JapanToshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, Japan
Ishiuchi, H
[1
]
Yoshida, T
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, JapanToshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, Japan
Yoshida, T
[1
]
Takato, H
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, JapanToshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, Japan
Takato, H
[1
]
Tomioka, K
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, JapanToshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, Japan
Tomioka, K
[1
]
Matsuo, K
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, JapanToshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, Japan
Matsuo, K
[1
]
Momose, H
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, JapanToshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, Japan
Momose, H
[1
]
Sawada, S
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, JapanToshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, Japan
Sawada, S
[1
]
Yamazaki, K
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, JapanToshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, Japan
Yamazaki, K
[1
]
Maeguchi, K
论文数: 0引用数: 0
h-index: 0
机构:
Toshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, JapanToshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, Japan
Maeguchi, K
[1
]
机构:
[1] Toshiba Corp, Semicond Grp, Microelect Engn Lab, Isogo Ku, Yokohama, Kanagawa 241, Japan
来源:
INTERNATIONAL ELECTRON DEVICES MEETING - 1997, TECHNICAL DIGEST
|
1997年
关键词:
D O I:
10.1109/IEDM.1997.649449
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Issues on embedded DRAM technologies including their applications, process options, and tradeoffs are discussed. Real implementations of the embedded DRAM technologies with 0.5 um, 0.35 um, and 0.25 um are also presented. The embedded DRAM technologies will be used to realize high bandwidth and low power operation.