Mapping the chemical states of an element inside a sample using tomographic x-ray absorption spectroscopy

被引:81
作者
Schroer, CG [1 ]
Kuhlmann, M
Günzler, TF
Lengeler, B
Richwin, M
Griesebock, B
Lützenkirchen-Hecht, D
Frahm, R
Ziegler, E
Mashayekhi, A
Haeffner, DR
Grunwaldt, JD
Baiker, A
机构
[1] Univ Aachen, Inst Phys 2, D-52056 Aachen, Germany
[2] Berg Univ Gesamthsch Wuppertal, Inst Mat Sci, D-42097 Wuppertal, Germany
[3] Berg Univ Gesamthsch Wuppertal, Dept Phys, D-42097 Wuppertal, Germany
[4] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[5] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
[6] ETH Honggerberg, Swiss Fed Inst Technol, Inst Chem & Bioengn, CH-8093 Zurich, Switzerland
关键词
D O I
10.1063/1.1573352
中图分类号
O59 [应用物理学];
学科分类号
摘要
Hard x-ray absorption spectroscopy is combined with scanning microtomography to reconstruct full near-edge spectra of an elemental species at each location on an arbitrary virtual section through a sample. These spectra reveal the local concentrations of different chemical compounds of the absorbing element inside the sample and give insight into the oxidation state, the local atomic structure, and the local projected free density of states. The method is implemented by combining a quick scanning monochromator and data acquisition system with a scanning microprobe setup based on refractive x-ray lenses. (C) 2003 American Institute of Physics.
引用
收藏
页码:3360 / 3362
页数:3
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