A seminumerical method to determine the depth profile of the three dimensional residual stress state with X-ray diffraction

被引:19
作者
Harting, M [1 ]
机构
[1] Univ Cape Town, Dept Phys, ZA-7700 Rondebosch, South Africa
关键词
D O I
10.1016/S1359-6454(97)00284-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A new method to determine, non-destructively, the full three-dimensional stress stale with depth resolution has been developed. Conventional X-ray residual stress techniques, using different characteristic radiations and several Bragg peaks, are combined with a seminumerical procedure. The analysis incorporates a model function based on the linear theory of elasticity, under consideration of its conditions of equilibrium as well as the surface boundary condition. A least squares fit of a calculated set of peak positions to the experimental data yields the depth dependence of all six components of the stress tenser. This method has been applied to a shot peened work piece, formed from the titanium based alloy Ti-6Al-4V. (C) 1998 Acta Metallurgica Inc.
引用
收藏
页码:1427 / 1436
页数:10
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