Mesoscopic microwave dispersion in ferroelectric thin films

被引：28

作者：

Hubert, C ^{[1
]}

Levy, J

Cukauskas, EJ

Kirchoefer, SW

机构：

[1] Univ Pittsburgh, Dept Phys & Astron, Pittsburgh, PA 15260 USA

[2] USN, Res Lab, Div Elect Sci & Technol, Washington, DC 20375 USA

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 85卷 / 09期

关键词：

D O I：

10.1103/PhysRevLett.85.1998

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The microwave dielectric response of a ferroelectric thin film is measured locally using time-resolved confocal scanning optical microscopy. Measurements performed on an ensemble of nanometer-scale regions show a well-defined phase shift between the paraelectric and ferroelectric response at 2-4 GHz. Application of a static electric field produces large local variations in the phase of the ferroelectric response. These variations are attributed to the growth of in-plane ferroelectric nanodomains whose size-dependent relaxation frequencies lead to strong dielectric dispersion at mesoscopic scales.

引用

页码：1998 / 2001

页数：4

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