Diffractional enhancement of the Kerr magnetooptic effect

被引:12
作者
Eremenko, V
Novosad, V
Pishko, V
Geoffroy, O
Souche, Y
Pannetier, B
机构
[1] UJF,CNRS,LAB MAGNETISME LOUIS NEEL,F-380164 GRENOBLE,FRANCE
[2] UJF,CNRS,CRTBT,F-38042 GRENOBLE,FRANCE
关键词
D O I
10.1134/1.567556
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The results of investigations of the transverse Kerr effect on an array of thin magnetic strips deposited on a silicon substrate are reported. The periodic structure of the sample gives rise to diffraction. It is observed that under certain experimental conditions the magnitude of the effect measured in diffracted beams is much greater than the maximum value for a sample with a uniform surface. (C) 1997 American Institute of Physics. [S0021-3640(97)00419-2].
引用
收藏
页码:494 / 497
页数:4
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