X-ray diffraction from single fibres of spider silk

被引：49

作者：

Bram, A ^{[1
]}

Branden, CI ^{[1
]}

Craig, C ^{[1
]}

Snigireva, I ^{[1
]}

Riekel, C ^{[1
]}

机构：

[1] HARVARD UNIV,MUSEUM COMPARAT ZOOL LABS,CAMBRIDGE,MA 02138

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1997年 / 30卷

关键词：

D O I：

10.1107/S0021889896012344

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Wide-angle X-ray diffraction patterns of single spider-silk fibres of less than or equal to 5 mu m diameter can be obtained at a third-generation synchrotron-radiation source in a few seconds per pattern. This is sufficient to observe the strongest equatorial and first layer line reflections. For higher-resolution structural work, data have to be recorded with cryocooling techniques in order to maintain the crystallinity of the sample for several minutes.

引用

页码：390 / 392

页数：3

共 13 条

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