Interferometer profile extraction using continuous wavelet transform

被引：13

作者：

Watkins, LR ^{[1
]}

Tan, SM ^{[1
]}

Barnes, TH ^{[1
]}

机构：

[1] Univ Auckland, Dept Phys, Auckland, New Zealand

来源：

ELECTRONICS LETTERS | 1997年 / 33卷 / 25期

关键词：

wavelet transforms; interferometry;

D O I：

10.1049/el:19971474

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The continuous wavelet transform may be used to accurately reconstruct surface profiles from two sets of Fizeau interferometer fringe data. In contrast to standard phase-stepping methods, the data may have any arbitrary phase-step between 0 and pi. The method enables considerable simplification of the measurment apparatus and yields accurate proffles, even in the presence of noise.

引用

页码：2116 / 2117

页数：2