A simple and fast TEM preparation method utilizing the pre-orientation in plate-like, needle-shaped and tubular materials

被引:21
作者
Müller, E [1 ]
Krumeich, F
机构
[1] Paul Scherrer Inst, Lab Micro & Nanostruct, CH-5232 Villigen, Switzerland
[2] ETH Zurich, Inorgan Chem Lab, CH-8092 Zurich, Switzerland
关键词
transmission electron microscopy; specimen preparation and handling;
D O I
10.1016/S0304-3991(00)00026-7
中图分类号
TH742 [显微镜];
学科分类号
摘要
In order to observe anisotropically grown crystalline materials perpendicular to a certain preferred orientation, a standard cross-sectional TEM preparation method has been modified. The material is embedded in an organic epoxy resin between two Si-wafers. Plates, needles and tubes lay flat inside the resulting sandwich, which is then cut into slices perpendicular to the wafers. The slices are thinned by mechanical abrading and, finally, by ion milling. Crystals located near the central hole are electron-transparent, and their orientation often allows for an observation along the desired direction. The usefulness of this procedure is demonstrated on the examples of high-T-c superconductors and vanadium oxide nanotubes. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:143 / 147
页数:5
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