Interpretation of "true atomic resolution" images of graphite (0001) in noncontact atomic force microscopy

被引:61
作者
Hölscher, H
Allers, W
Schwarz, UD
Schwarz, A
Wiesendanger, R
机构
[1] Univ Hamburg, Inst Appl Phys, D-20355 Hamburg, Germany
[2] Univ Hamburg, Microstruct Res Ctr, D-20355 Hamburg, Germany
来源
PHYSICAL REVIEW B | 2000年 / 62卷 / 11期
关键词
D O I
10.1103/PhysRevB.62.6967
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To examine the contrast formation by noncontact atomic force microscopy (NC-AFM), we simulate images of graphite (0001) and compare them with experimental results. Important features of the experimental data like the appearance of a trigonal structure with a distance of 2.46 Angstrom between the maxima and the experimental corrugation amplitudes are well reproduced. The detailed analysis shows that the NC-AFM images reveal the positions of the carbon atoms as minima and the hollow sites as maxima, in contrast to a simple interpretation of NC-AFM data.
引用
收藏
页码:6967 / 6970
页数:4
相关论文
共 32 条
[1]   Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon(111) surface [J].
Allers, W ;
Schwarz, A ;
Schwarz, UD ;
Wiesendanger, R .
EUROPHYSICS LETTERS, 1999, 48 (03) :276-279
[2]   Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite (0001) [J].
Allers, W ;
Schwarz, A ;
Schwarz, UD ;
Wiesendanger, R .
APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :247-252
[3]   Scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures [J].
Allers, W ;
Schwarz, A ;
Schwarz, UD ;
Wiesendanger, R .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (01) :221-225
[4]  
BAMMERLIN M, 1997, PROBE MICROSCOPY, V1, P3
[5]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[6]   ATOMIC RESOLUTION WITH ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
GERBER, C ;
STOLL, E ;
ALBRECHT, TR ;
QUATE, CF .
EUROPHYSICS LETTERS, 1987, 3 (12) :1281-1286
[7]   TIP-SAMPLE INTERACTION EFFECTS IN SCANNING-TUNNELING AND ATOMIC-FORCE MICROSCOPY [J].
CIRACI, S ;
BARATOFF, A ;
BATRA, IP .
PHYSICAL REVIEW B, 1990, 41 (05) :2763-2775
[8]   Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy [J].
Dürig, U .
APPLIED PHYSICS LETTERS, 1999, 75 (03) :433-435
[9]   Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7x7 [J].
Erlandsson, R ;
Olsson, L ;
Martensson, P .
PHYSICAL REVIEW B, 1996, 54 (12) :R8309-R8312
[10]  
FUJISAWA S, 1996, TRIBOL LETT, V1, P121