Interference in light scattering from slightly rough dielectric layers

被引:6
作者
Kaganovskii, YS [1 ]
Freilikher, VD [1 ]
Kanzieper, E [1 ]
Nafcha, Y [1 ]
Rosenbluh, M [1 ]
机构
[1] Bar Ilan Univ, Dept Phys, Jack & Pearl Resnick Inst Adv Technol, IL-52900 Ramat Gan, Israel
关键词
D O I
10.1364/OL.23.000316
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The scattering of light from a slightly rough surface overlying a reflecting surface is investigated. It is shown that the long-scale component of the roughness spectrum plays a critical role in the scattering patterns obtained. The scattered interference patterns are critically dependent on small variation of the rms height of the long-scale component of the roughness. Conventional perturbation theory is found to be invalid in cases in which interference phenomena in the scattering are of importance. A model is proposed that quantitatively describes the measured angular intensity distributions. (C) 1998 Optical Society of America.
引用
收藏
页码:316 / 318
页数:3
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