Origin of preferential orthorhombic twinning in SrRuO3 epitaxial thin firms

被引：51

作者：

Maria, JP ^{[1
]}

McKinstry, HL ^{[1
]}

Trolier-McKinstry, S ^{[1
]}

机构：

[1] Penn State Univ, Dept Mat Sci & Engn, Mat Res Lab, University Pk, PA 16802 USA

来源：

APPLIED PHYSICS LETTERS | 2000年 / 76卷 / 23期

关键词：

D O I：

10.1063/1.126654

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In order to elucidate the driving forces which promote oriented in-plane crystallographic texture: in SrRuO3 thin films deposited on stepped SrTiO3 substrates, a high-temperature x-ray analysis of both SrRuO3 thin films and powders was conducted. Structural phase transitions were found at temperatures near 350 degrees C and slightly above 600 degrees C. The transitions are tentatively indexed as orthorhombic to tetragonal and tetragonal to cubic, respectively. These results suggest that SrBuO3 thin films grow with cubic symmetry. As such, Aim-substrate interfacial characteristics, rather than a preferred growth direction, are believed to determine the orientation of orthorhombic twins. (C) 2000 American Institute of Physics. [S0003-6951(00)00423-X].

引用

页码：3382 / 3384

页数：3

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