Microrobot system for automatic nanohandling inside a scanning electron microscope

被引:62
作者
Fatikow, Sergej [1 ]
Wich, Thomas
Huelsen, Helge
Sievers, Torsten
Jaehnisch, Marco
机构
[1] Carl von Ossietzky Univ Oldenburg, Div Microrobot & Control Engn, D-26111 Oldenburg, Germany
[2] OFFIS, R&D Div Microsyst Technol & Nanohandling, D-26121 Oldenburg, Germany
关键词
intelligent control; microrobots; nanohandling automation; scanning electron microscope (SEM) image processing;
D O I
10.1109/TMECH.2007.897252
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, current research work on the development of an automated nanohandling station in a scanning electron microscope (SEM) is presented. An experimental setup is described, in which two mobile microrobots cooperate in the vacuum chamber of an SEM. The robots are positioned by a closed-loop controller with sensor data, which is provided by three charge-coupled device cameras and the SEM. Continuous pose estimation is carried out by processing noisy SEM images in real time. To enable the automation of complex tasks, a client-server control system that can integrate various microrobots and sensors is introduced. Finally, the overall system is evaluated by automatic handling of transmission electron microscope lamellae.
引用
收藏
页码:244 / 252
页数:9
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